Abstract
High efficiency MIS inversion layer (MIS/IL) silicon solar cells have been fabricated by using silicon oxynitride as ultra-thin tunneling film. The characteristics and the thermal stability of the cells are improved considerably when the tunneling film is formed directly under ammonia at low temperature and low pressure. Short circuit current density of 35.2 mA/cm2 and conversion efficiency of 13.5% (AM 1.5, 100 mW/cm2, 25° C) have been achieved with this method when single layer plasma silicon nitride is used as AR coating and CZ silicon as the substrate.
| Original language | English |
|---|---|
| Pages (from-to) | 257-263 |
| Number of pages | 7 |
| Journal | Solar Energy Materials |
| Volume | 17 |
| Issue number | 4 |
| DOIs | |
| State | Published - Jun 1988 |
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