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Hidden Interface Driven Exchange Coupling in Oxide Heterostructures

  • Aiping Chen
  • , Qiang Wang
  • , Michael R. Fitzsimmons
  • , Erik Enriquez
  • , Marcus Weigand
  • , Zach Harrell
  • , Brian McFarland
  • , Xujie Lü
  • , Paul Dowden
  • , Judith L. MacManus-Driscoll
  • , Dmitry Yarotski
  • , Quanxi Jia
  • Los Alamos National Laboratory
  • Argonne National Laboratory
  • West Virginia University
  • Oak Ridge National Laboratory
  • University of Tennessee
  • University of Cambridge

Research output: Contribution to journalArticlepeer-review

27 Scopus citations

Abstract

A variety of emergent phenomena have been enabled by interface engineering in complex oxides. The existence of an intrinsic interfacial layer has often been found at oxide heterointerfaces. However, the role of such an interlayerin controlling functionalities is not fully explored. Here, we report the control of the exchange bias (EB) in single-phase manganite thin films with nominallyuniform chemical composition across the interfaces. The sign of EB depends on the magnitude of the cooling field. A pinned layer, confirmed by polarized neutron reflectometry, provides the source of unidirectional anisotropy. The origin of the exchange bias coupling is discussed in terms of magnetic interactions between the interfacial ferromagnetically reduced layer and the bulk ferromagnetic region. The sign of EB is related to the frustration of antiferromagnetic coupling between the ferromagnetic region and the pinned layer. Our results shed new light on using oxide interfaces to design functional spintronic devices.

Original languageEnglish
Article number1700672
JournalAdvanced Materials
Volume29
Issue number26
DOIs
StatePublished - Jul 12 2017

Keywords

  • epitaxial thin films
  • interface
  • magnetism
  • polarized neutron reflectometry

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