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Heteroepitaxy of large grain Ge film on cube-textured Ni(001) foils through CaF2 buffer layer

  • Liang Chen
  • , Weiyu Xie
  • , Gwo Ching Wang
  • , Ishwara Bhat
  • , Shengbai Zhang
  • , Amit Goyal
  • , Toh Ming Lu
  • Rensselaer Polytechnic Institute

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Cube-textured Ni(001) foils have been considered as a viable alternative substrate to grow high quality functional films for large area optoelectronic devices. In this work, we report the heteroepitaxial growth of CaF2(001) films on cube-textured Ni(001) foils at 350-600 °C with in-plane orientation of CaF2[110]//Ni[100] and CaF2[1-10]//Ni[010] with 45° rotation respect to the Ni(001) substrate. Unlike CaF2(111)/Ni(001) films where there exist four independent rotational domains with rotational domain boundaries, CaF2(001)/Ni(001) contains no rotational domains or rotational domain boundaries. This makes CaF2(001)/Ni(001) films better candidates as templates for the growth of high quality functional semiconductors. We also demonstrate that Ge(001) film with no rotational domains and with a grain size of ∼50 μm similar to that of the Ni substrate can be grown on the CaF2(001) buffered Ni substrate.

Original languageEnglish
Pages (from-to)428-434
Number of pages7
JournalThin Solid Films
Volume603
DOIs
StatePublished - Mar 31 2016

Keywords

  • Biaxial film
  • Buffer layer
  • Germanium
  • Heteroepitaxy
  • Large grain size
  • Nickel foils
  • X-ray diffraction

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