Abstract
Pinning in YBa2Cu3O7-x (YBCO) films is compared with mixed rare-earth (RE) films. The field dependence of critical current density and pinning force plots at 75.5 K are analysed. The work provides a guideline as to how to optimize pinning by inclusion of both random and correlated defects. In summary, Y mixed with larger RE ions appears to be optimum for effective pinning across a wide field regime as well as permitting growth at temperatures low enough for technological use.
| Original language | English |
|---|---|
| Pages (from-to) | S55-S59 |
| Journal | Superconductor Science and Technology |
| Volume | 19 |
| Issue number | 3 |
| DOIs | |
| State | Published - Mar 1 2006 |
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