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Guest Editors' Introduction: Machine Intelligence at the Edge

  • ETH Zïrich
  • University of Illinois at Urbana-Champaign
  • Cornell University

Research output: Contribution to journalEditorial

Original languageEnglish
Article number9499316
Pages (from-to)5-6
Number of pages2
JournalIEEE Design and Test
Volume38
Issue number4
DOIs
StatePublished - Aug 2021

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