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Giant magneto-optical Kerr enhancement from films on SiC due to the optical properties of the substrate

  • A. Mukherjee
  • , C. T. Ellis
  • , M. M. Arik
  • , P. Taheri
  • , E. Oliverio
  • , P. Fowler
  • , J. G. Tischler
  • , Y. Liu
  • , E. R. Glaser
  • , R. L. Myers-Ward
  • , J. L. Tedesco
  • , C. R. Eddy
  • , D. Kurt Gaskill
  • , H. Zeng
  • , G. Wang
  • , J. Cerne
  • SUNY Buffalo
  • Naval Research Laboratory
  • CAS - Institute of Physics

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We report a giant enhancement of the midinfrared magneto-optical complex Kerr angle (polarization change of reflected light) in a variety of materials grown on SiC. In epitaxially grown multilayer graphene, the Kerr angle is enhanced by a factor of 68, which is in good agreement with Kerr signal modeling. Strong Kerr enhancement is also observed in Fe films grown on SiC and Al-doped bulk SiC. Our experiments and modeling indicate that the enhancement occurs at the high-energy edge of the SiC reststrahlen band where the real component of the complex refractive index n passes through unity. Furthermore, since the signal is greatly enhanced when n=1, the enhancement is predicted to exist over the entire visible and IR spectrum for a free-standing film. We also predict similar giant enhancement in both Faraday (transmission) and Kerr rotation for thin films on a metamaterial substrate with refractive index n=-1. This paper demonstrates that the substrate used in magneto-optical Kerr effect (MOKE) measurements must be carefully chosen when investigating magneto-optical materials with weak MOKE signals or when designing MOKE-based optoelectronic devices.

Original languageEnglish
Article number085440
JournalPhysical Review B
Volume99
Issue number8
DOIs
StatePublished - Feb 27 2019

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