Abstract
Electrical transport and resistance noise spectroscopy measurements are performed on individual, single crystalline Bi2S3 nanowires in the field-effect geometry. The nanowires exhibit n-type conduction and device characteristics such as activation energy, ON/OFF ratio, and mobility are calculated over a temperature range of 120–320 K and at several bias values. The noise magnitude is measured between 0.01 and 5 Hz at several gate voltages as the device turns from it's OFF to ON state. The presence of mid-gap states which act as charge traps within the band gap can potentially explain the observed transport characteristics. Sulfur vacancies are the likely origin of these mid-gap states which makes Bi2S3 nanowires appealing for defect engineering as a means to enhance its optoelectronic properties and also to better understand the important role of defects in nanoscale semiconductors.
| Original language | English |
|---|---|
| Pages (from-to) | 135-139 |
| Number of pages | 5 |
| Journal | Solid State Communications |
| Volume | 270 |
| DOIs | |
| State | Published - Feb 2018 |
Keywords
- Mid-gap states
- Nanowire transistors
- Noise spectroscopy
- Semiconducting chalcogenides
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