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Frequency limits of InP-based integrated circuits

  • Mark Rodwell
  • , E. Lind
  • , Z. Griffith
  • , S. R. Bank
  • , A. M. Crook
  • , U. Singisetti
  • , M. Wistey
  • , G. Burek
  • , A. C. Gossard
  • University of California at Santa Barbara
  • University of Texas at Austin

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

23 Scopus citations

Abstract

We examine the limits in scaling of InP-based bipolar and field effect transistors for increased device bandwidth. With InP-based HBTs, emitter and base contact resistivities and IC thermal resistance are the major limits to increased device bandwidth; devices with 1-1.5 THz simultaneous f τ and fmax are feasible. Major challenges faced in developing either InGaAs HEMTs having THz cutoff frequencies or InGaAs-channel MOSFETs having drive current consistent with the 22 nm ITRS objectives include the low two-dimensional effective density of states and the high bound state energies in narrow quantum wells.

Original languageEnglish
Title of host publicationIPRM'07
Subtitle of host publicationIEEE 19th International Conference on Indium Phosphide and Related Materials - Conference Proceedings
Pages9-13
Number of pages5
DOIs
StatePublished - 2007
EventIPRM'07: IEEE 19th International Conference on Indium Phosphide and Related Materials - Matsue, Japan
Duration: May 14 2007May 18 2007

Publication series

NameConference Proceedings - International Conference on Indium Phosphide and Related Materials
ISSN (Print)1092-8669

Conference

ConferenceIPRM'07: IEEE 19th International Conference on Indium Phosphide and Related Materials
Country/TerritoryJapan
CityMatsue
Period05/14/0705/18/07

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