Frequency dependent effective masses in Si inversion layers at metallic densities

T. A. Kennedy; R. J. Wagner; B. D. McCombe; D. C. Tsui

doi:10.1016/0039-6028(76)90133-3

Frequency dependent effective masses in Si inversion layers at metallic densities

T. A. Kennedy
, R. J. Wagner
, B. D. McCombe
, D. C. Tsui

Physics

Naval Research Laboratory
Nokia

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Original language	English
Pages (from-to)	185-186
Number of pages	2
Journal	Surface Science
Volume	58
Issue number	1
DOIs	https://doi.org/10.1016/0039-6028(76)90133-3
State	Published - Aug 1 1976

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title = "Frequency dependent effective masses in Si inversion layers at metallic densities",

author = "Kennedy, \{T. A.\} and Wagner, \{R. J.\} and McCombe, \{B. D.\} and Tsui, \{D. C.\}",

year = "1976",

month = aug,

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doi = "10.1016/0039-6028(76)90133-3",

language = "English",

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journal = "Surface Science",

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T1 - Frequency dependent effective masses in Si inversion layers at metallic densities

AU - Kennedy, T. A.

AU - Wagner, R. J.

AU - McCombe, B. D.

AU - Tsui, D. C.

PY - 1976/8/1

Y1 - 1976/8/1

UR - https://www.scopus.com/pages/publications/4243059789

U2 - 10.1016/0039-6028(76)90133-3

DO - 10.1016/0039-6028(76)90133-3

M3 - Article

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SN - 0039-6028

VL - 58

SP - 185

EP - 186

JO - Surface Science

JF - Surface Science

IS - 1

ER -

Frequency dependent effective masses in Si inversion layers at metallic densities

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