Skip to main navigation Skip to search Skip to main content

Fano resonance membrane reflectors from mid-infrared to far-infrared

  • Yichen Shuai
  • , Deyin Zhao
  • , Weiquan Yang
  • , Weidong Zhou
  • , Jung Hun Seo
  • , Zhenqiang Ma
  • , Gautam Medhi
  • , Robert Peale
  • , Walter Buchwald
  • , Richard Soref
  • University of Texas at Arlington
  • University of Wisconsin-Madison
  • University of Central Florida
  • Air Force Research Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Compact broadband reflectors (BBRs) are of great importance for optoelectronic devices and photonic integrated circuits like lasers, photodetectors, solar cells, and sensors, etc. Traditionally, they can be realized by using metal films or stacked dielectric thin films. Metal films can offer larger reflection bandwidth but are limited by their intrinsic absorption losses. Stacked dielectric thin films can achieve very low losses. But they typically require many individual layers with stringent refractive index and thickness tolerances for each layer. It becomes more of an engineering challenge to realize extremely high reflection DBRs at longer wavelengths, including mid-IR, far-IR, and THz frequencies, due to the scaling of quarter-wavelength stack dielectrics.

Original languageEnglish
Title of host publicationIEEE Photonic Society 24th Annual Meeting, PHO 2011
Pages787-788
Number of pages2
DOIs
StatePublished - 2011
Event24th Annual Meeting on IEEE Photonic Society, PHO 2011 - Arlington, VA, United States
Duration: Oct 9 2011Oct 13 2011

Publication series

NameIEEE Photonic Society 24th Annual Meeting, PHO 2011

Conference

Conference24th Annual Meeting on IEEE Photonic Society, PHO 2011
Country/TerritoryUnited States
CityArlington, VA
Period10/9/1110/13/11

Fingerprint

Dive into the research topics of 'Fano resonance membrane reflectors from mid-infrared to far-infrared'. Together they form a unique fingerprint.

Cite this