Extended x-ray absorption fine structure studies of diffused copper impurities in ZnSe

A. I. Goldman; E. Canova; Y. H. Kao; B. J. Fitzpatrick; R. N. Bhargava; James C. Phillips

doi:10.1063/1.94513

Extended x-ray absorption fine structure studies of diffused copper impurities in ZnSe

A. I. Goldman
, E. Canova
, Y. H. Kao
, B. J. Fitzpatrick
, R. N. Bhargava
, James C. Phillips

Physics

Stony Brook University
Koninklijke Philips N.V.
State University of New York System

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

We have performed the first extended x-ray absorption fine structure investigation of the local environment around dilute copper impurities diffused into the II-VI semiconductor ZnSe. An average first nearest neighbor distance of 2.32±0.06 Å is obtained. Our results indicate a rather large distortion of the local environment surrounding the copper impurities and/or displacement of these impurity atoms from simple substitutional sites (Cu _Zn) and high symmetry interstitial sites (Cu_I).

Original language	English
Pages (from-to)	836-838
Number of pages	3
Journal	Applied Physics Letters
Volume	43
Issue number	9
DOIs	https://doi.org/10.1063/1.94513
State	Published - 1983

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@article{7c793e23b7694a20bef05c38bc33a79a,

title = "Extended x-ray absorption fine structure studies of diffused copper impurities in ZnSe",

abstract = "We have performed the first extended x-ray absorption fine structure investigation of the local environment around dilute copper impurities diffused into the II-VI semiconductor ZnSe. An average first nearest neighbor distance of 2.32±0.06 {\AA} is obtained. Our results indicate a rather large distortion of the local environment surrounding the copper impurities and/or displacement of these impurity atoms from simple substitutional sites (Cu Zn) and high symmetry interstitial sites (CuI).",

author = "Goldman, \{A. I.\} and E. Canova and Kao, \{Y. H.\} and Fitzpatrick, \{B. J.\} and Bhargava, \{R. N.\} and Phillips, \{James C.\}",

year = "1983",

doi = "10.1063/1.94513",

language = "English",

volume = "43",

pages = "836--838",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "9",

}

TY - JOUR

T1 - Extended x-ray absorption fine structure studies of diffused copper impurities in ZnSe

AU - Goldman, A. I.

AU - Canova, E.

AU - Kao, Y. H.

AU - Fitzpatrick, B. J.

AU - Bhargava, R. N.

AU - Phillips, James C.

PY - 1983

Y1 - 1983

N2 - We have performed the first extended x-ray absorption fine structure investigation of the local environment around dilute copper impurities diffused into the II-VI semiconductor ZnSe. An average first nearest neighbor distance of 2.32±0.06 Å is obtained. Our results indicate a rather large distortion of the local environment surrounding the copper impurities and/or displacement of these impurity atoms from simple substitutional sites (Cu Zn) and high symmetry interstitial sites (CuI).

AB - We have performed the first extended x-ray absorption fine structure investigation of the local environment around dilute copper impurities diffused into the II-VI semiconductor ZnSe. An average first nearest neighbor distance of 2.32±0.06 Å is obtained. Our results indicate a rather large distortion of the local environment surrounding the copper impurities and/or displacement of these impurity atoms from simple substitutional sites (Cu Zn) and high symmetry interstitial sites (CuI).

UR - https://www.scopus.com/pages/publications/1542359828

U2 - 10.1063/1.94513

DO - 10.1063/1.94513

M3 - Article

AN - SCOPUS:1542359828

SN - 0003-6951

VL - 43

SP - 836

EP - 838

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 9

ER -

Extended x-ray absorption fine structure studies of diffused copper impurities in ZnSe

Abstract

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