Abstract
The domain walls (DW) trapped by submicron notches were studied experimentally. The presence of DWs was probed through electronic transport measurements and by magnetic force microscopy (MFM). It was found that the shape and the stability of the wall appeared to be dependent on the trapping position. The results show the existence of multiple stable locations for a domain wall trapped by a submicron notch by changing the MFM scanning history.
| Original language | English |
|---|---|
| Pages (from-to) | 1910-1912 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 84 |
| Issue number | 11 |
| DOIs | |
| State | Published - Mar 15 2004 |
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