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Experimental evidence of multiple stable locations for a domain wall trapped by a submicron notch

  • D. Lacour
  • , J. A. Katine
  • , L. Folks
  • , T. Block
  • , J. R. Childress
  • , M. J. Carey
  • , B. A. Gurney
  • Hitachi, Ltd.

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Abstract

The domain walls (DW) trapped by submicron notches were studied experimentally. The presence of DWs was probed through electronic transport measurements and by magnetic force microscopy (MFM). It was found that the shape and the stability of the wall appeared to be dependent on the trapping position. The results show the existence of multiple stable locations for a domain wall trapped by a submicron notch by changing the MFM scanning history.

Original languageEnglish
Pages (from-to)1910-1912
Number of pages3
JournalApplied Physics Letters
Volume84
Issue number11
DOIs
StatePublished - Mar 15 2004

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