Abstract
We consider a continuum model for the evolution of an epitaxially strained dislocation-free thin solid film on a deformable substrate in the absence of vapor deposition. By using a thin-film approximation we derived a nonlinear evolution equation. We examined the nonlinear evolution equation and found that there is a critical film thickness below which every film thickness is stable and a critical wave number above which every film thickness is stable. Preliminary numerical results indicate that the equation possesses island-like steady state solutions.
| Original language | English |
|---|---|
| Pages (from-to) | 5505-5512 |
| Number of pages | 8 |
| Journal | Journal of Applied Physics |
| Volume | 96 |
| Issue number | 10 |
| DOIs | |
| State | Published - Nov 15 2004 |
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