Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry

Jeremy A. Felton; Gregory D. Schilling; Steven J. Ray; Roger P. Sperline; M. Bonner Denton; Charles J. Barinaga; David W. Koppenaal; Gary M. Hieftje

doi:10.1039/c0ja00087f

Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry

Jeremy A. Felton
, Gregory D. Schilling
, Steven J. Ray
, Roger P. Sperline
, M. Bonner Denton
, Charles J. Barinaga
, David W. Koppenaal
, Gary M. Hieftje

Chemistry

Indiana University Bloomington
University of Arizona
Pacific Northwest National Laboratory

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

A fourth-generation focal plane camera containing 1696 Faraday-strip detectors was fitted to a Mattauch-Herzog mass spectrograph and characterized for its performance with inductively coupled plasma ionization. The camera provides limits of detection in the single to tens of ng L^-1 range for most elements and has a linear dynamic range of at least nine orders of magnitude. Isotope-ratio precision better than 0.02% has also been achieved with this device, and this fourth-generation system features the broadest simultaneous mass range obtainable to date with this family of focal plane camera detectors.

Original language	English
Pages (from-to)	300-304
Number of pages	5
Journal	Journal of Analytical Atomic Spectrometry
Volume	26
Issue number	2
DOIs	https://doi.org/10.1039/c0ja00087f
State	Published - Feb 2011

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abstract = "A fourth-generation focal plane camera containing 1696 Faraday-strip detectors was fitted to a Mattauch-Herzog mass spectrograph and characterized for its performance with inductively coupled plasma ionization. The camera provides limits of detection in the single to tens of ng L-1 range for most elements and has a linear dynamic range of at least nine orders of magnitude. Isotope-ratio precision better than 0.02\% has also been achieved with this device, and this fourth-generation system features the broadest simultaneous mass range obtainable to date with this family of focal plane camera detectors.",

author = "Felton, \{Jeremy A.\} and Schilling, \{Gregory D.\} and Ray, \{Steven J.\} and Sperline, \{Roger P.\} and Denton, \{M. Bonner\} and Barinaga, \{Charles J.\} and Koppenaal, \{David W.\} and Hieftje, \{Gary M.\}",

year = "2011",

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doi = "10.1039/c0ja00087f",

language = "English",

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T1 - Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry

AU - Felton, Jeremy A.

AU - Schilling, Gregory D.

AU - Ray, Steven J.

AU - Sperline, Roger P.

AU - Denton, M. Bonner

AU - Barinaga, Charles J.

AU - Koppenaal, David W.

AU - Hieftje, Gary M.

PY - 2011/2

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N2 - A fourth-generation focal plane camera containing 1696 Faraday-strip detectors was fitted to a Mattauch-Herzog mass spectrograph and characterized for its performance with inductively coupled plasma ionization. The camera provides limits of detection in the single to tens of ng L-1 range for most elements and has a linear dynamic range of at least nine orders of magnitude. Isotope-ratio precision better than 0.02% has also been achieved with this device, and this fourth-generation system features the broadest simultaneous mass range obtainable to date with this family of focal plane camera detectors.

AB - A fourth-generation focal plane camera containing 1696 Faraday-strip detectors was fitted to a Mattauch-Herzog mass spectrograph and characterized for its performance with inductively coupled plasma ionization. The camera provides limits of detection in the single to tens of ng L-1 range for most elements and has a linear dynamic range of at least nine orders of magnitude. Isotope-ratio precision better than 0.02% has also been achieved with this device, and this fourth-generation system features the broadest simultaneous mass range obtainable to date with this family of focal plane camera detectors.

UR - https://www.scopus.com/pages/publications/79251569927

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DO - 10.1039/c0ja00087f

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EP - 304

JO - Journal of Analytical Atomic Spectrometry

JF - Journal of Analytical Atomic Spectrometry

IS - 2

ER -

Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry

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