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Evaluating effects of constant and pulsed current in pulse initiated systems

  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Fuses are designed to protect electrical systems from atypical characteristic events like overcurrent impulses. Most fuses are one shot devices, as the protection of the other circuit components come from the breaking of the sacrificial device, therefore nuisance failures present a problem. Transient currents can cause unforeseen stress to electrical devices, including pulse initiated systems, which can lead to malfunctions, damage and even permanent failure of the system. In order to quantify the detrimental effects transient currents can have on pulse initiated systems this research will test fuses under both constant and pulsing signals of different amplitudes. Upon completion, any changes in the fuse's average opening times will be evaluated to determine if there were any quantifiable effects that have contributed to the aging process.

Original languageEnglish
Title of host publicationProceedings of the 2014 IEEE International Power Modulator and High Voltage Conference, IPMHVC 2014
EditorsAllen L. Garner
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages380-383
Number of pages4
ISBN (Electronic)9781467373234
DOIs
StatePublished - 2014
EventIEEE International Power Modulator and High Voltage Conference, IPMHVC 2014 - Santa Fe, United States
Duration: Jun 1 2014 → Jun 5 2014

Publication series

NameProceedings of the 2014 IEEE International Power Modulator and High Voltage Conference, IPMHVC 2014

Conference

ConferenceIEEE International Power Modulator and High Voltage Conference, IPMHVC 2014
Country/TerritoryUnited States
CitySanta Fe
Period06/1/14 → 06/5/14

Keywords

  • Constant Current
  • Fuse
  • Pulsed Current
  • Transient current

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