Abstract
The etch-decoration electron microscopy technique serves as a unique tool for measuring the rates of gas-carbon reactions on well-defined active sites on graphite. The turnover frequency on a single-layer edge is very different from that on multilayer edges measured by other techniques. Hence the etch-decoration technique does not give overall rates for any carbon meterial. The technique has been well developed. A step-by-step, easy-to-follow experimental procedure which has been used to obtain reproducible data is given.
| Original language | English |
|---|---|
| Title of host publication | Chem and Phys of Carbon |
| Publisher | Marcel Dekker Inc. |
| Pages | 163-210 |
| Number of pages | 48 |
| Volume | 19 |
| ISBN (Print) | 0824772458 |
| State | Published - 1984 |
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