TY - GEN
T1 - Error feedback based noise shaping in a double sampled ADC
AU - Sarma, Vineeth
AU - Sahoo, Bibhudatta
PY - 2012
Y1 - 2012
N2 - A first order error feedback based noise shaping in a double sampled ADC is proposed. This topology is ideal for nanometer CMOS technology, as it obviates the need for high-gain and high output-swing op amps and fast-settling, power-hungry, and noisy reference buffers. Using a one stage op amp with a gain of 70 (i.e. 37 dB) and output swing of ±75 mV , this topology, realized in GPDK 90-nm CMOS technology, achieves an SNDR of 60 dB operating at 1 GHz (effective sample rate of 2 GHz due to double sampling) with an OSR of 32.
AB - A first order error feedback based noise shaping in a double sampled ADC is proposed. This topology is ideal for nanometer CMOS technology, as it obviates the need for high-gain and high output-swing op amps and fast-settling, power-hungry, and noisy reference buffers. Using a one stage op amp with a gain of 70 (i.e. 37 dB) and output swing of ±75 mV , this topology, realized in GPDK 90-nm CMOS technology, achieves an SNDR of 60 dB operating at 1 GHz (effective sample rate of 2 GHz due to double sampling) with an OSR of 32.
UR - https://www.scopus.com/pages/publications/84868270778
U2 - 10.1109/NEWCAS.2012.6329003
DO - 10.1109/NEWCAS.2012.6329003
M3 - Conference contribution
AN - SCOPUS:84868270778
SN - 9781467308595
T3 - 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
SP - 249
EP - 252
BT - 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
T2 - 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
Y2 - 17 June 2012 through 20 June 2012
ER -