Abstract
Epitaxial GaN thin films have been deposited on (0001) sapphire substrates by a chemical solution approach of polymer-assisted deposition. The films are smooth with no detectable cracks or pores, as observed by scanning electron microscopy and atomic force microscopy. Microstructural studies by X-ray diffraction and transmission electron microscopy show that the GaN films have a hexagonal structure with an epitaxial relationship between the film and the substrate of (0001) GaN||(0001) Al203 and [112̄0] GaN||[101̄0] Al203. The films with a room temperature resistivity of around 0.13 ω · cm exhibit photoluminescence characteristic of wurtzite hexagonal GaN.
| Original language | English |
|---|---|
| Pages (from-to) | 20535-20538 |
| Number of pages | 4 |
| Journal | Journal of Physical Chemistry C |
| Volume | 112 |
| Issue number | 51 |
| DOIs | |
| State | Published - 2008 |
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