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Epitaxial GaN thin films prepared by polymer-assisted deposition

  • Hongmei Luo
  • , Y. Lin
  • , H. Wang
  • , Chia Yun Chou
  • , N. A. Suvorova
  • , M. E. Hawley
  • , A. H. Mueller
  • , F. Ronning
  • , E. Bauer
  • , A. K. Burrell
  • , Mark McCIeskey
  • , Q. X. Jia
  • Los Alamos National Laboratory
  • University of Electronic Science and Technology of China
  • Texas A&M University
  • Los Alamos National Laboratory Materials Science and Technology Division

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

Epitaxial GaN thin films have been deposited on (0001) sapphire substrates by a chemical solution approach of polymer-assisted deposition. The films are smooth with no detectable cracks or pores, as observed by scanning electron microscopy and atomic force microscopy. Microstructural studies by X-ray diffraction and transmission electron microscopy show that the GaN films have a hexagonal structure with an epitaxial relationship between the film and the substrate of (0001) GaN||(0001) Al203 and [112̄0] GaN||[101̄0] Al203. The films with a room temperature resistivity of around 0.13 ω · cm exhibit photoluminescence characteristic of wurtzite hexagonal GaN.

Original languageEnglish
Pages (from-to)20535-20538
Number of pages4
JournalJournal of Physical Chemistry C
Volume112
Issue number51
DOIs
StatePublished - 2008

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