Abstract
We report the small-signal high-frequency performance of novel enhancement-mode N-polar GaN metal-insulator-semiconductor field effect transistors with a peak short-circuit current gain cutoff frequency (ft) of 120 GHz for a 70-nm gate length device. The device has an 8-nm GaN channel with AlN back barrier and a 5-nm SiNx gate dielectric. These devices show a peak drain current of 0.74A/mm and peak transconductance of 260mS/mm at a drain bias of 3.0 V. This is the first demonstration of high-frequency operation of N-polar enhancementmode GaN devices.
| Original language | English |
|---|---|
| Article number | 24103 |
| Journal | Applied Physics Express |
| Volume | 4 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2011 |
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