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Enhanced flux-pinning in dy-doped, MOD YBCO films on RABiTS

  • A. Goyal
  • , J. Li
  • , P. M. Martin
  • , A. Gapud
  • , E. D. Specht
  • , M. Paranthaman
  • , X. Li
  • , W. Zhang
  • , T. Kodenkandath
  • , M. W. Rupich
  • Oak Ridge National Laboratory
  • University of South Alabama
  • American Superconductor Corporation

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Significant enhancements in flux-pinning were obtained for Dy-doped, YBCO films via a metalorganic deposition (MOD) process on rolling-assisted biaxially textured substrates (RABiTS). It has been reported previously that incorporation of excess rare-earth ions during the MOD process, results in improvement of Jc for H//c, however, a decrease in Jc for H//ab is observed. We report here that by altering the processing conditions the reduction in the magnitude of the current peak for H//ab can be minimized while significantly enhancing the random pinning at all field orientations. The result is a YBCO film with significantly reduced anisotropy compared to the typical YBCO films prepared by the MOD process. This is accomplished by incorporating both a high density of stacking faults and (Dy, Y)2O3 nanoparticles which result in the strong pinning for H//ab and a broad pinning peak for H//c respectively.

Original languageEnglish
Pages (from-to)3340-3342
Number of pages3
JournalIEEE Transactions on Applied Superconductivity
Volume17
Issue number2
DOIs
StatePublished - Jun 2007

Keywords

  • Angular dependence
  • Coated conductor
  • Critical current density
  • Flux-pinning
  • Intergrowths
  • MOD films
  • Nanodots
  • RABiTS
  • Stacking faults
  • Wires

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