Abstract
We have heteroepitaxially deposited pure and TiO2-doped Ba 0.6Sr0.4TiO3(BST-0.4) films on (001)-oriented MgO substrates using pulsed-laser deposition. By optimizing microstructures, we have successfully increased the dielectric nonlinearity and decreased the dielectric loss of BST films. By inserting a very thin Ba1-xSr xTiO3 (x = 0.1-0.7) interlayer between the MgO substrate and the main layer of BST-0.4, we are able to manipulate strain states and dielectric properties of BST-0.4 films. In addition, we have systematically compared the dielectric properties of pure and TiO2-doped BST-0.4 films.
| Original language | English |
|---|---|
| Pages (from-to) | 7222-7225 |
| Number of pages | 4 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 41 |
| Issue number | 11 B |
| DOIs | |
| State | Published - Nov 2002 |
Keywords
- BaSrTio
- Dielectric properties
- Microstructure
- Strain states
- TiO-doped
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