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Emitter-base design tradeoffs in 120GHZ sige HBTs

  • A. Joseph
  • , X. Liu
  • , P. Geiss
  • , M. Slusser
  • , W. Hodge
  • , M. Dupuis
  • , R. Wuthrich
  • , J. Nakos
  • , J. Dunn
  • Global Foundries, Inc.

Research output: Contribution to conferencePaperpeer-review

Abstract

We present a detailed study on the tradeoffs in emitter-base profile optimization for a 120GHz SiGe HBT. The influence of two key process variables on the HBT electrical characteristics were investigated. Results indicate that careful optimization of the emitter-base profile will be required to achieve critical HBT performance parameters. The impact of these process variables to the low frequency noise characteristics have been compared as well. 1/f noise reduction can be achieved by optimizing the emitter doping concentration.

Original languageEnglish
Pages45-51
Number of pages7
StatePublished - 2004
EventSiGe: Materials, Processing, and Devices - Proceedings of the First Symposium - Honolulu, HI, United States
Duration: Oct 3 2004Oct 8 2004

Conference

ConferenceSiGe: Materials, Processing, and Devices - Proceedings of the First Symposium
Country/TerritoryUnited States
CityHonolulu, HI
Period10/3/0410/8/04

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