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Electronic states in La2-xSrxCuO4+ probed by soft-x-ray absorption

  • C. T. Chen
  • , F. Sette
  • , Y. Ma
  • , M. S. Hybertsen
  • , E. B. Stechel
  • , W. M.C. Foulkes
  • , M. Schulter
  • , S. W. Cheong
  • , A. S. Cooper
  • , L. W. Rupp
  • , B. Batlogg
  • , Y. L. Soo
  • , Z. H. Ming
  • , A. Krol
  • , Y. H. Kao
  • Nokia
  • Sandia National Laboratories, New Mexico
  • SUNY Buffalo

Research output: Contribution to journalArticlepeer-review

476 Scopus citations

Abstract

Oxygen K-edge absorption spectra of carefully characterized La2-xSrxCuO4+ samples were measured using a bulk-sensitive fluoresence-yield-detection method. They reveal two distinct pre-edge peaks which evolve systematically as a function of Sr concentration. The measured spectra are quantitatively described by calculations based on the Hubbard model, including local Coulomb interactions and core-hole excitonic correlations. The absorption data are consistent with a description of electronic states based on a doped charge-transfer insulator.

Original languageEnglish
Pages (from-to)104-107
Number of pages4
JournalPhysical Review Letters
Volume66
Issue number1
DOIs
StatePublished - 1991

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