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Electron irradiation induced crystallization of amorphous Al2O3 films on silicon substrates

  • J. Liu
  • , C. J. Barbero
  • , J. W. Corbett
  • , K. Rajan
  • , H. Leary
  • Technology in Automation and Robotics

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

An in situ study of electron beam irradiation induced amorphous-to-crystalline transformation of Al2O3 films on silicon substrates has been carried out using transmission electron microscopy. Trigonal α-Al2O3 crystallites can be observed for electron beam dose rates larger than 10 mA/cm2. It is found that the nucleation and growth processes dominate near the Al2O3-Si interface. The possible effect of the silicon substrate on the growth of Al2O3 crystallites is considered.

Original languageEnglish
Title of host publicationThermodynamics and Kinetics
PublisherPubl by Materials Research Society
Pages239-244
Number of pages6
ISBN (Print)1558992073, 9781558992078
DOIs
StatePublished - 1993
EventProceedings of the Symposium on Phase Transformations in Thin Films - San Francisco, CA, USA
Duration: Apr 13 1993Apr 15 1993

Publication series

NameMaterials Research Society Symposium Proceedings
Volume311
ISSN (Print)0272-9172

Conference

ConferenceProceedings of the Symposium on Phase Transformations in Thin Films
CitySan Francisco, CA, USA
Period04/13/9304/15/93

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