Abstract
We perform electrical characterization of epitaxial FeSi2 nanowires (NWs) realized by reactive epitaxy. Typical resistance values exceed 100 k, a high value that is attributed to the combined influence of interfacial scattering and process-related damage. Negative magnetoresistance due to weak localization, as well as hysteresis and anisotropic magnetoresistance, are also observed at low temperatures, confirming the ferromagnetic nature of these NWs.
| Original language | English |
|---|---|
| Article number | 263111 |
| Journal | Applied Physics Letters |
| Volume | 97 |
| Issue number | 26 |
| DOIs | |
| State | Published - Dec 27 2010 |
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