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Electrical properties of field-effect transistors based on C 60 nanowhiskers

  • Kenichi Ogawa
  • , Tomohiro Kato
  • , Asato Ikegami
  • , Hajime Tsuji
  • , Nobuyuki Aoki
  • , Yuichi Ochiai
  • , Jonathan P. Bird
  • Chiba University

Research output: Contribution to journalArticlepeer-review

85 Scopus citations

Abstract

We fabricate field-effect transistors (FETs) based on C 60 nanowhiskers (C 60 NWs) and investigate their structural and electrical properties. Thermally annealed C 60 NWs show x-ray powder-diffraction spectra that are consistent with a similar fee structure to that of C 60 bulk crystals, although with a slightly reduced lattice constant (a = 13.9 Å). The C 60 NW-FETs exhibit n-channel, normally-on, properties (or FETs) and their carrier mobility is estimated to be 2 × 10 -2 cm 2/V s under vacuum conditions at room temperature.

Original languageEnglish
Article number112109
JournalApplied Physics Letters
Volume88
Issue number11
DOIs
StatePublished - 2006

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