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Electrical properties 2: Electron transport studies in β-Ga2O3

  • SUNY Buffalo
  • University of Michigan, Ann Arbor

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

1 Scopus citations

Abstract

This chapter discusses the electron transport properties and their implications on power devices under very high electric fields (>1 MV/cm). A combination of first-principles calculation of microscopic interactions, Monte Carlo simulation of electron transport, and TCAD simulation on power transistors manifests a bottom-up view of the hot electron dynamics in β-Ga2O3 devices. While the focus of the chapter is on impact ionization and resulting avalanche breakdown, a brief overview on low-field and moderately high-field transport are also presented. The role of crystal orientation on breakdown is discussed in detail. Compact model parameters for breakdown phenomena are provided. Estimates of breakdown field are shown through simple analytical calculations and also through a TCAD simulation.

Original languageEnglish
Title of host publicationSpringer Series in Materials Science
PublisherSpringer
Pages407-420
Number of pages14
DOIs
StatePublished - 2020

Publication series

NameSpringer Series in Materials Science
Volume293
ISSN (Print)0933-033X
ISSN (Electronic)2196-2812

Keywords

  • 2DEG
  • Anisotropy
  • Avalanche breakdown
  • Bas-centered monoclinic crystal
  • Bloch oscillations
  • Chynoweth parameters
  • Critical electric field
  • Electron transport
  • Electron-–electron interactions
  • Electron–phonon interactions
  • Full-band Monte Carlo
  • Impact ionization
  • Intraband scattering
  • Ionization integral
  • LO-plasmon coupling
  • Mobility
  • Polar optical phonons
  • Screening
  • TCAD simulation
  • Velocity saturation
  • Β-GaO

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