Skip to main navigation Skip to search Skip to main content

Elastic modulus of Pb/Sn solder joints in microelectronics

  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Young's modulus (E) values published in the literature for the eutectic Pb37/Sn63 and near eutectic Pb40/Sn60 solder alloy vary significantly. One reason for this discrepancy is different testing methods for highly rate sensitive heterogeneous materials, like Pb/Sn alloys, yield different results. In this paper, we study different procedures used to obtain the elastic modulus; analytically, by single crystal elasticity and experimentally by ultrasonic testing and Nano indentation. We compare these procedures and propose a procedure for elastic modulus determination. The deformation kinetics of the Pb/Sn solder alloys is discussed at the grain size level.

Original languageEnglish
Title of host publicationElectronic and Photonic Packaging, Electrical Systems Design and Photonics, and Nanotechnology
PublisherAmerican Society of Mechanical Engineers (ASME)
Pages141-150
Number of pages10
ISBN (Print)0791836487, 9780791836484
DOIs
StatePublished - 2002

Publication series

NameASME International Mechanical Engineering Congress and Exposition, Proceedings

Fingerprint

Dive into the research topics of 'Elastic modulus of Pb/Sn solder joints in microelectronics'. Together they form a unique fingerprint.

Cite this