Abstract
Concurrent thermal cycling and vibration tests were conducted to explore the cyclic behavior of solder joints and plasticity in vibration coupled with thermal cycling. Actual ball grid array (BGA) packages were used for testing. High sensitivity moire interferometry was used to capture the in-plane cyclic inelastic deformation field with submicron resolution.
| Original language | English |
|---|---|
| Volume | 9 |
| No | 9 |
| Specialist publication | Advanced Packaging |
| State | Published - Oct 2000 |
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