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Effects of inductance on the metallization removal of exploding films

  • Mark T. Muffoletto
  • , Antonio Upia
  • , Thomas M. Disanto
  • , Daniel P. Muffoletto
  • , Kevin M. Burk
  • , Jennifer L. Zirnheld
  • , Harry L. Moore
  • , Hardev Singh
  • , Preston Haney
  • SUNY Buffalo
  • Bldg 65N

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

During the electrical explosion of a thin metallized film, the metallization layer is heated rapidly up to vaporization where the film bursts and the metal layer is ejected from the substrate. It has been shown that adding inductance in the dis-charge path changes the characteristics of the explosion; most notably it alters the energy transfer efficiency. This work sets out to explore the metallization removed as a function of in-ductance, namely how much of the metallized surface is liber-ated during the explosion of the film. An image processing technique is used to quantify the metallization removal and the results of this effort are discussed herein.

Original languageEnglish
Title of host publicationIEEE Conference Record - PPC 2011, Pulsed Power Conference 2011
Subtitle of host publicationThe 18th IEEE International Pulsed Power Conference
Pages446-448
Number of pages3
DOIs
StatePublished - 2011
Event18th IEEE International Pulsed Power Conference, PPC 2011 - Chicago, IL, United States
Duration: Jun 19 2011Jun 23 2011

Publication series

NameDigest of Technical Papers-IEEE International Pulsed Power Conference

Conference

Conference18th IEEE International Pulsed Power Conference, PPC 2011
Country/TerritoryUnited States
CityChicago, IL
Period06/19/1106/23/11

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