Abstract
The effect of thermal annealing on the boundary chemistry of Tl-1223 compounds (TlxBa2Ca2Cu3Oy) is studied. Results reveal that the enhancement of Jc in Tl-1223 films does not result from improvement of the properties of twist grain boundaries. The microstructure has been shown from X-ray diffraction and electron back-scattering diffraction studies to consist of colonies of grains with similar but not identical basal plane orientations, and it has been suggested that long-range conduction occurs through a percolative network of small-angle tilt boundaries at colony intersections.
| Original language | English |
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| Pages | 968-969 |
| Number of pages | 2 |
| State | Published - 1994 |
| Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Conference
| Conference | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
|---|---|
| City | New Orleans, LA, USA |
| Period | 07/31/94 → 08/5/94 |
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