Abstract
MoO3 thin films were deposited on glass substrates at various growth temperatures and oxygen flow rates by radio-frequency reactive magnetron sputtering. The effect of the growth temperature and oxygen flow rate on the structural, morphological, and optical properties of the MoO3 thin films was investigated. The X-ray diffraction patterns revealed that only the film deposited with an oxygen flow rate of 10% exhibited a monoclinic structure, whereas the other films were amorphous. Energy-dispersive spectrometry analyses revealed that all films were composed of Mo and O. The average optical transmittance was 93% for the wavelength range of 400–1100 nm at a growth temperature of 100 C. The band gap energy and transmittance of the MoO3 thin films depended significantly on the growth temperature and oxygen flow rate, revealing their importance for growing high-quality MoO3 thin films.
| Original language | English |
|---|---|
| Pages (from-to) | 7623-7627 |
| Number of pages | 5 |
| Journal | Journal of Nanoscience and Nanotechnology |
| Volume | 17 |
| Issue number | 10 |
| DOIs | |
| State | Published - Oct 2017 |
Keywords
- Growth Temperature
- Sputtering
- Thin Film
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