Skip to main navigation Skip to search Skip to main content

Effect of Low-Intensity-Low-Temperature and High Radiation conditions on Flexible Cu(In,Ga)Se2 Solar Cells

  • C. R. Brown
  • , H. Afshari
  • , V. R. Whiteside
  • , D. Poplavskyy
  • , K. Hossain
  • , M. Dhoubhadel
  • , I. R. Sellers
  • University of Oklahoma
  • MiaSolé Hi-Tech Corp Santa Clara
  • Amethyst Research Inc

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Commercially available flexible Cu(In,Ga)Se2 solar cells are assessed at Low-Intensity-Low-Temperature (LILT) conditions consistent with those expected in the outer planetary systems of Saturn, Jupiter, and Mars. In these lower temperature environments, evidence of a photo-activated barrier is observed, which is attributed to the contribution of a parasitic barrier at the CIGS/CdS interface that is mediated by metastable defect complexes. Under LILT conditions, the barrier results in only a small reduction in performance. Studies of irradiation with very high fluences levels of 1.5 MeV protons are also presented, resulting in defect-related degradation. Self-healing under annealing and illumination is also observed.

Original languageEnglish
Title of host publication2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2835-2837
Number of pages3
ISBN (Electronic)9781728104942
DOIs
StatePublished - Jun 2019
Event46th IEEE Photovoltaic Specialists Conference, PVSC 2019 - Chicago, United States
Duration: Jun 16 2019Jun 21 2019

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference46th IEEE Photovoltaic Specialists Conference, PVSC 2019
Country/TerritoryUnited States
CityChicago
Period06/16/1906/21/19

Fingerprint

Dive into the research topics of 'Effect of Low-Intensity-Low-Temperature and High Radiation conditions on Flexible Cu(In,Ga)Se2 Solar Cells'. Together they form a unique fingerprint.

Cite this