Abstract
High quality perovskite Nd 0.6Sr 0.33MnO 3 thin films were grown on LaAlO 3 single crystal substrates using pulsed laser ablation. The detailed microstructure studies of the films were carried out using x-ray diffraction, transmission electron microscopy (TEM), and high-resolution TEM. These studies were correlated with the transport properties of the films, including their magnetization and electrical resistivity. The results show that high degree of crystallinity leads to improved transport properties like smaller resistivities at both peak and room temperatures.
| Original language | English |
|---|---|
| Pages (from-to) | 1147-1149 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 84 |
| Issue number | 7 |
| DOIs | |
| State | Published - Feb 16 2004 |
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