Abstract
We use a new method for visualization and direct experimental study of dynamic magnetization processes and for nondestructive characterization of the defect structure of magnetic multilayers. The method utilizes a transparent indicator ferrimagnetic magneto-optic film with in-plane anisotropy. An example of its application to the investigation of the magnetization reversal by domain wall motion in electrochemically produced CoNiCu/Cu multilayers which exhibit a giant magnetoresistance effect is described.
| Original language | English |
|---|---|
| Pages (from-to) | 4088-4090 |
| Number of pages | 3 |
| Journal | IEEE Transactions on Magnetics |
| Volume | 31 |
| Issue number | 6 |
| DOIs | |
| State | Published - Nov 1995 |
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