Abstract
We present results from the direct electrical measurement of an as-grown nanowire. The nickel suicide (NiSi) nanowire was spontaneously grown across a trench between two electrodes used for measurement. The NiSi nanowire, 58 nm in diameter and 2.9 μm in length, showed a low resistance characteristic of 147.9 Ω. This unique method is straightforward and does not require removal of a grown nanowire to be moved into a measurement environment.
| Original language | English |
|---|---|
| Pages (from-to) | 1356-1359 |
| Number of pages | 4 |
| Journal | Nano Letters |
| Volume | 6 |
| Issue number | 7 |
| DOIs | |
| State | Published - Jul 2006 |
Fingerprint
Dive into the research topics of 'Direct electrical measurement of the self-assembled nickel suicide nanowire'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver