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Direct electrical measurement of the self-assembled nickel suicide nanowire

  • SUNY Buffalo
  • Pohang University of Science and Technology

Research output: Contribution to journalArticlepeer-review

73 Scopus citations

Abstract

We present results from the direct electrical measurement of an as-grown nanowire. The nickel suicide (NiSi) nanowire was spontaneously grown across a trench between two electrodes used for measurement. The NiSi nanowire, 58 nm in diameter and 2.9 μm in length, showed a low resistance characteristic of 147.9 Ω. This unique method is straightforward and does not require removal of a grown nanowire to be moved into a measurement environment.

Original languageEnglish
Pages (from-to)1356-1359
Number of pages4
JournalNano Letters
Volume6
Issue number7
DOIs
StatePublished - Jul 2006

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