Dielectric response and structural properties of TiO2-doped Ba0.6Sr0.4TiO3 films

Q. X. Jia; B. H. Park; B. J. Gibbons; J. Y. Huang; P. Lu

doi:10.1063/1.1491287

Dielectric response and structural properties of TiO₂-doped Ba_0.6Sr_0.4TiO₃ films

Q. X. Jia
, B. H. Park
, B. J. Gibbons
, J. Y. Huang
, P. Lu

Department of Materials Design and Innovation

Los Alamos National Laboratory
New Mexico Institute of Mining and Technology

Research output: Contribution to journal › Article › peer-review

29 Scopus citations

Abstract

Dielectric Ba_0.6Sr_0.4TiO₃ films doped with different weight percentages of TiO₂ were deposited by pulsed-laser deposition. The dielectric constant, dielectric loss, and the dielectric tunability of the films were found to be a strong function of the weight ratio of TiO₂/Ba_0.6Sr_0.4TiO₃. Compared to the pure Ba_0.6Sr_0.4TiO₃, the TiO ₂-doped Ba_0.6Sr_0.4TiO₃ exhibits lower dielectric loss while maintaining a significantly adjustable dielectric constant and desirable capacitance tunability. The change of the dielectric properties of TiO₂-doped Ba_0.6Sr_0.4TiO ₃ films is closely related to the change in microstructure of the films as revealed by transmission electron microscopy.

Original language	English
Pages (from-to)	114-116
Number of pages	3
Journal	Applied Physics Letters
Volume	81
Issue number	1
DOIs	https://doi.org/10.1063/1.1491287
State	Published - Jul 1 2002

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abstract = "Dielectric Ba0.6Sr0.4TiO3 films doped with different weight percentages of TiO2 were deposited by pulsed-laser deposition. The dielectric constant, dielectric loss, and the dielectric tunability of the films were found to be a strong function of the weight ratio of TiO2/Ba0.6Sr0.4TiO3. Compared to the pure Ba0.6Sr0.4TiO3, the TiO 2-doped Ba0.6Sr0.4TiO3 exhibits lower dielectric loss while maintaining a significantly adjustable dielectric constant and desirable capacitance tunability. The change of the dielectric properties of TiO2-doped Ba0.6Sr0.4TiO 3 films is closely related to the change in microstructure of the films as revealed by transmission electron microscopy.",

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T1 - Dielectric response and structural properties of TiO2-doped Ba0.6Sr0.4TiO3 films

AU - Jia, Q. X.

AU - Park, B. H.

AU - Gibbons, B. J.

AU - Huang, J. Y.

AU - Lu, P.

PY - 2002/7/1

Y1 - 2002/7/1

N2 - Dielectric Ba0.6Sr0.4TiO3 films doped with different weight percentages of TiO2 were deposited by pulsed-laser deposition. The dielectric constant, dielectric loss, and the dielectric tunability of the films were found to be a strong function of the weight ratio of TiO2/Ba0.6Sr0.4TiO3. Compared to the pure Ba0.6Sr0.4TiO3, the TiO 2-doped Ba0.6Sr0.4TiO3 exhibits lower dielectric loss while maintaining a significantly adjustable dielectric constant and desirable capacitance tunability. The change of the dielectric properties of TiO2-doped Ba0.6Sr0.4TiO 3 films is closely related to the change in microstructure of the films as revealed by transmission electron microscopy.

AB - Dielectric Ba0.6Sr0.4TiO3 films doped with different weight percentages of TiO2 were deposited by pulsed-laser deposition. The dielectric constant, dielectric loss, and the dielectric tunability of the films were found to be a strong function of the weight ratio of TiO2/Ba0.6Sr0.4TiO3. Compared to the pure Ba0.6Sr0.4TiO3, the TiO 2-doped Ba0.6Sr0.4TiO3 exhibits lower dielectric loss while maintaining a significantly adjustable dielectric constant and desirable capacitance tunability. The change of the dielectric properties of TiO2-doped Ba0.6Sr0.4TiO 3 films is closely related to the change in microstructure of the films as revealed by transmission electron microscopy.

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Dielectric response and structural properties of TiO₂-doped Ba_0.6Sr_0.4TiO₃ films

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