TY - GEN
T1 - Developing Measurement Models Using Bayesian Neural Networks
AU - Heidary, Roohollah
AU - Williams, Jesse
AU - Sun, Hongyue
AU - Xu, Chenyu
AU - Moreira, Paulo
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - This paper presents the development and application of a Bayesian neural network (BNN) model to quantify the measurement uncertainty of non-contact articulating arms (NCAA) in measuring cylinder radii for criticality-based guard banding in quality control. Using real data, the study demonstrates the effectiveness of NCAAs, which produce point cloud data more quickly than traditional Coordinate Measuring Machines (CMMs), in alleviating manufacturing bottlenecks. Integrating this machine learning (ML) model into the manufacturing workflow significantly enhances process efficiency. Specifically, the model reduces reliance on CMMs in quality manufacturing processes, leading to faster operations and cost savings in quality control and reliability analysis of manufactured parts.
AB - This paper presents the development and application of a Bayesian neural network (BNN) model to quantify the measurement uncertainty of non-contact articulating arms (NCAA) in measuring cylinder radii for criticality-based guard banding in quality control. Using real data, the study demonstrates the effectiveness of NCAAs, which produce point cloud data more quickly than traditional Coordinate Measuring Machines (CMMs), in alleviating manufacturing bottlenecks. Integrating this machine learning (ML) model into the manufacturing workflow significantly enhances process efficiency. Specifically, the model reduces reliance on CMMs in quality manufacturing processes, leading to faster operations and cost savings in quality control and reliability analysis of manufactured parts.
KW - Bayesian neural network
KW - Criticality-based guard banding
KW - Measurement uncertainty quantification
KW - Quality control
UR - https://www.scopus.com/pages/publications/105002274026
U2 - 10.1109/RAMS48127.2025.10935089
DO - 10.1109/RAMS48127.2025.10935089
M3 - Conference contribution
AN - SCOPUS:105002274026
T3 - Proceedings - Annual Reliability and Maintainability Symposium
BT - 2025 71st Annual Reliability and Maintainability Symposium, RAMS 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 71st Annual Reliability and Maintainability Symposium, RAMS 2025
Y2 - 27 January 2025 through 30 January 2025
ER -