@inproceedings{5fe7154afddc47c5b0657962cb811999,
title = "Deterministic Dither Based Mismatch Characterization of Wide Range of Metal-Oxide-Metal Capacitors",
abstract = "This paper proposes a deterministic dither based capacitor mismatch measurement using a low-resolution analog-to- digital converter for a wide range of Metal-Oxide-Metal capacitor values (20 fF to 1 pF), thereby facilitating easier integration alongside actual blocks which use those capacitors. In this work, deterministic dithering has been demonstrated to be an effective method for mismatch estimation, reducing hardware overhead and relaxing the design of the analog-to-digital converter used to obtain the mismatch. System level simulations using MATLAB and subsequent circuit level simulations in UMC 65-nm show that the proposed technique can measure absolute capacitor mismatch to within 15-bits of accuracy and also statistically characterize capacitor mismatch having standard deviation as small as 0.01 \%.",
keywords = "capacitor mismatch, Dither, monte-carlo, stochastic",
author = "Harshit Roy and Arkaprova Ray and Sahoo, \{Bibhu Datta\}",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 63rd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2020 ; Conference date: 09-08-2020 Through 12-08-2020",
year = "2020",
month = aug,
doi = "10.1109/MWSCAS48704.2020.9184450",
language = "English",
series = "Midwest Symposium on Circuits and Systems",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "880--884",
booktitle = "2020 IEEE 63rd International Midwest Symposium on Circuits and Systems, MWSCAS 2020 - Proceedings",
address = "United States",
}