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Detecting Cyberbullying in Visual Content: A Large Vision-Language Model Approach

  • Jaden Mu
  • , David Cong
  • , Helen Qin
  • , Ishan Ajay
  • , Keyan Guo
  • , Nishant Vishwamitra
  • , Hongxin Hu
  • East Chapel Hill High School
  • Williamsville East High School
  • Thomas Jefferson High School for Science and Technology
  • John Glenn School
  • SUNY Buffalo
  • University of Texas at San Antonio

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Cyberbullying has rapidly evolved with the evolution of online platforms, transcending traditional text-based forms to include images and other multimedia content. Two major challenges are identified in detecting cyberbullying images: recognizing cyberbullying-related visual factors and addressing the context-dependent nature of such images. In this paper, we conduct a comprehensive investigation of the ability of Large Vision-Language Models (LVLMs) to evaluate visual factors related to cyberbullying, and to interpret the context-dependent nature of such images. Furthermore, by proposing a diverse set of prompting strategies, we optimize LVLMs for cyberbullying image detection. In particular, through our carefully crafted Chain-of-Thought (CoT) methodology, we guide the model through structured reasoning pathways to interpret complex visual factors and account for their context. Our results show that the structured reasoning pathways significantly enhance model performance, achieving state-of-the-art accuracy and precision while remaining efficient by eliminating the need for any extensive training process.

Original languageEnglish
Title of host publicationProceedings - 2024 International Conference on Machine Learning and Applications, ICMLA 2024
EditorsM. Arif Wani, Plamen Angelov, Feng Luo, Mitsunori Ogihara, Xintao Wu, Radu-Emil Precup, Ramin Ramezani, Xiaowei Gu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1663-1668
Number of pages6
ISBN (Electronic)9798350374889
DOIs
StatePublished - 2024
Event23rd IEEE International Conference on Machine Learning and Applications, ICMLA 2024 - Miami, United States
Duration: Dec 18 2024Dec 20 2024

Publication series

NameProceedings - 2024 International Conference on Machine Learning and Applications, ICMLA 2024

Conference

Conference23rd IEEE International Conference on Machine Learning and Applications, ICMLA 2024
Country/TerritoryUnited States
CityMiami
Period12/18/2412/20/24

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