Skip to main navigation Skip to search Skip to main content

Data retention characteristics of Bi3.25 La0.75 Ti3 O12 thin films on conductive SrRu O3 electrodes

  • Los Alamos National Laboratory
  • Kookmin University
  • Samsung

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

Ferroelectric Bi3.25 La0.75 Ti3 O12 (BLT) thin films were deposited on SrRu O3 (SRO) and Pt electrodes by pulsed laser deposition. The data retention characteristics of the BLT films on different electrode materials were characterized. The experimental results are well fitted by a stretched exponential decay model, indicating that BLT films on both Pt and SRO exhibit the similar decay mechanisms. However, the decay behavior is quite different due to the use of different bottom electrodes. The superior data retention performance of BLT film on conductive SRO electrode is believed to be from the reduction of domain polarization backswitching originated from the oxygen vacancies in the depletion region of BLT films.

Original languageEnglish
Article number142901
JournalApplied Physics Letters
Volume91
Issue number14
DOIs
StatePublished - 2007

Fingerprint

Dive into the research topics of 'Data retention characteristics of Bi3.25 La0.75 Ti3 O12 thin films on conductive SrRu O3 electrodes'. Together they form a unique fingerprint.

Cite this