Abstract
Ions with similar time-of-flights (TOF) can be discriminated by mapping their kinetic energy. While current generation position-sensitive detectors have been considered insufficient for capturing the isotope kinetic energy, we demonstrate in this paper that statistical learning methodologies can be used to capture the kinetic energy from all of the parameters currently measured by mathematically transforming the signal. This approach works because the kinetic energy is sufficiently described by the descriptors on the potential, the material, and the evaporation process within atom probe tomography (APT). We discriminate the isotopes for Mg and Al by capturing the kinetic energy, and then decompose the TOF spectrum into its isotope components and identify the isotope for each individual atom measured. This work demonstrates the value of advanced data mining methods to help enhance the information resolution of the atom probe.
| Original language | English |
|---|---|
| Pages (from-to) | 121-128 |
| Number of pages | 8 |
| Journal | Ultramicroscopy |
| Volume | 132 |
| DOIs | |
| State | Published - Sep 2013 |
Keywords
- Atom probe tomography (APT)
- Data visualization
- Eigenvalue decomposition
- Kinetic energy discrimination
- Principal component analysis (PCA)
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