Data intensive imaging for 3D Atom Probe

Scott R. Broderick; Santoshrupa Dumpala; Sonal Padalkar; Krishna Rajan

doi:10.1017/S1431927614005789

Data intensive imaging for 3D Atom Probe

Scott R. Broderick
, Santoshrupa Dumpala
, Sonal Padalkar
, Krishna Rajan

Department of Materials Design and Innovation

Iowa State University

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	812-813
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614005789
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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@article{55033208f36b4ef0a084b2c8b7dad758,

title = "Data intensive imaging for 3D Atom Probe",

author = "Broderick, \{Scott R.\} and Santoshrupa Dumpala and Sonal Padalkar and Krishna Rajan",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614005789",

language = "English",

volume = "20",

pages = "812--813",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - Data intensive imaging for 3D Atom Probe

AU - Broderick, Scott R.

AU - Dumpala, Santoshrupa

AU - Padalkar, Sonal

AU - Rajan, Krishna

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927916490

U2 - 10.1017/S1431927614005789

DO - 10.1017/S1431927614005789

M3 - Conference article

AN - SCOPUS:84927916490

SN - 1431-9276

VL - 20

SP - 812

EP - 813

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Data intensive imaging for 3D Atom Probe

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