Skip to main navigation Skip to search Skip to main content

Data-Driven Observer Based Detection for Series Arc Fault in DC Microgrids

  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Series dc arc fault generates arcing noise that propagates throughout the whole system, making it difficult to identify the fault location. In this article, series arc fault detection and localization are investigated for dc microgrids with distributed generation units (DGUs) using data-driven unknown input observer (UIO). The observer is designed using the data collected from the system without requiring knowledge of the system parameters, and it can be used to detect and locate series arc faults. When a series arc fault occurs, the residual generated by the observer increases, indicating the fault's location. The gains of the observers are tuned properly to enhance the state estimation performance and series arc fault detectability. The proposed UIOs are validated through Simulink simulation and hardware-in-loop real-time simulation tests.

Original languageEnglish
Title of host publication2024 IEEE Energy Conversion Congress and Exposition, ECCE 2024 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1477-1483
Number of pages7
ISBN (Electronic)9798350376067
DOIs
StatePublished - 2024
Event2024 IEEE Energy Conversion Congress and Exposition, ECCE 2024 - Phoenix, United States
Duration: Oct 20 2024Oct 24 2024

Publication series

Name2024 IEEE Energy Conversion Congress and Exposition, ECCE 2024 - Proceedings

Conference

Conference2024 IEEE Energy Conversion Congress and Exposition, ECCE 2024
Country/TerritoryUnited States
CityPhoenix
Period10/20/2410/24/24

Keywords

  • Arc fault
  • Data-driven
  • Detection
  • Microgrids
  • Observers

Fingerprint

Dive into the research topics of 'Data-Driven Observer Based Detection for Series Arc Fault in DC Microgrids'. Together they form a unique fingerprint.

Cite this