Crystallographic evolution in directionally solidified microstructures

Jeffrey A. Trogolo; Krishna Rajan

Crystallographic evolution in directionally solidified microstructures

Jeffrey A. Trogolo
, Krishna Rajan

Department of Materials Design and Innovation

Rensselaer Polytechnic Institute

Research output: Contribution to conference › Paper › peer-review

Abstract

In this paper we describe the crystallographic characterization of directionally solidified nickel base superalloys using electron diffraction techniques. It is shown that there appears to be some maximum level of misorientation that is prevalent in the low-angle boundary population in these systems. The misorientation distribution has two subpopulations: below about 6° and between 10-15°. The origin of these sub-populations is related to the high temperature boundary structure near T_m. The results are important to high-temperature processing, particularly hot deformation and directional solidification.

Original language	English
Pages	39-47
Number of pages	9
State	Published - 1998
Event	Proceedings of the 1998 TMS Annual Meeting - San Antonio, TX, USA Duration: Feb 15 1998 → Feb 19 1998

Conference

Conference	Proceedings of the 1998 TMS Annual Meeting
City	San Antonio, TX, USA
Period	02/15/98 → 02/19/98

Cite this

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title = "Crystallographic evolution in directionally solidified microstructures",

abstract = "In this paper we describe the crystallographic characterization of directionally solidified nickel base superalloys using electron diffraction techniques. It is shown that there appears to be some maximum level of misorientation that is prevalent in the low-angle boundary population in these systems. The misorientation distribution has two subpopulations: below about 6° and between 10-15°. The origin of these sub-populations is related to the high temperature boundary structure near Tm. The results are important to high-temperature processing, particularly hot deformation and directional solidification.",

author = "Trogolo, \{Jeffrey A.\} and Krishna Rajan",

year = "1998",

language = "English",

pages = "39--47",

note = "Proceedings of the 1998 TMS Annual Meeting ; Conference date: 15-02-1998 Through 19-02-1998",

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TY - CONF

T1 - Crystallographic evolution in directionally solidified microstructures

AU - Trogolo, Jeffrey A.

AU - Rajan, Krishna

PY - 1998

Y1 - 1998

N2 - In this paper we describe the crystallographic characterization of directionally solidified nickel base superalloys using electron diffraction techniques. It is shown that there appears to be some maximum level of misorientation that is prevalent in the low-angle boundary population in these systems. The misorientation distribution has two subpopulations: below about 6° and between 10-15°. The origin of these sub-populations is related to the high temperature boundary structure near Tm. The results are important to high-temperature processing, particularly hot deformation and directional solidification.

AB - In this paper we describe the crystallographic characterization of directionally solidified nickel base superalloys using electron diffraction techniques. It is shown that there appears to be some maximum level of misorientation that is prevalent in the low-angle boundary population in these systems. The misorientation distribution has two subpopulations: below about 6° and between 10-15°. The origin of these sub-populations is related to the high temperature boundary structure near Tm. The results are important to high-temperature processing, particularly hot deformation and directional solidification.

UR - https://www.scopus.com/pages/publications/0031679578

M3 - Paper

AN - SCOPUS:0031679578

SP - 39

EP - 47

T2 - Proceedings of the 1998 TMS Annual Meeting

Y2 - 15 February 1998 through 19 February 1998

ER -

Crystallographic evolution in directionally solidified microstructures

Abstract

Conference

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