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Cryogenic processing of metal/InP/schottky contacts

  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Cryogenic processing was developed to make high quality Schottky contacts to n-InP. The current-voltage (I-V) and capacitance-voltage (C-V) characteristics showed that the Schottky diodes formed at low temperature (LT=77k) had a much higher barrier height than those formed at room temperature (RT=300K). The leakage current of the LT diodes was reduced about 7 orders in magnitude with respect to the RT diodes. The barrier height was increased from 0.48 to 0.96 eV with Pd. The barrier height enhancement was confirmed by electroreflectance (ER) measurements. These results suggested Fermi level unpinning by the low temperature deposition. From Raman spectroscopy, a 20 to 30 Å amorphous-like structure was found at the interface of the LT diode. The amorphous layer serves as an insulator and gives the LT diode a metal-insulator-semiconductor (MlS)-like structure. At the RT diode interface, no such amorphous structure was found. Instead, a phosphide-related compound was observed in the Raman spectra. This implies a reaction between the metal and InP at the interface for RT diodes. The stable characteristics of the LT diodes were demonstrated by the near zero deviation in barrier height and ideality factor after long-term testing. The cryogenic processing provides an easy way to enhance the barrier height and has potential application in MESFET fabrication.

Original languageEnglish
Title of host publicationLEOS 1992 Summer Topical Meeting Digest on Broadband Analog and Digital Optoelectronics, Optical Multiple Access Networks, Integrated Optoelectronics, and Smart Pixels - 4th International Conference on Indium Phosphide and Related Materials, IPRM 1992
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages332-335
Number of pages4
ISBN (Electronic)0780305221, 9780780305229
DOIs
StatePublished - 1992
EventLEOS 1992 Summer Topical Meeting Digest on Broadband Analog and Digital Optoelectronics, Optical Multiple Access Networks, Integrated Optoelectronics, and Smart Pixels - 4th International Conference on Indium Phosphide and Related Materials, IPRM 1992 - Newport, United States
Duration: Apr 21 1992Apr 24 1992

Publication series

NameLEOS 1992 Summer Topical Meeting Digest on Broadband Analog and Digital Optoelectronics, Optical Multiple Access Networks, Integrated Optoelectronics, and Smart Pixels - 4th International Conference on Indium Phosphide and Related Materials, IPRM 1992

Conference

ConferenceLEOS 1992 Summer Topical Meeting Digest on Broadband Analog and Digital Optoelectronics, Optical Multiple Access Networks, Integrated Optoelectronics, and Smart Pixels - 4th International Conference on Indium Phosphide and Related Materials, IPRM 1992
Country/TerritoryUnited States
CityNewport
Period04/21/9204/24/92

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