Critical current modeling for coated conductor applications

Noel A. Rutter; Amit Goyal

Critical current modeling for coated conductor applications

Noel A. Rutter
, Amit Goyal

Department of Chemical and Biological Engineering

University of Cambridge

Research output: Contribution to journal › Conference article › peer-review

Abstract

A Monte-Carlo grain growth simulation has been coupled with existing grain boundary percolation models to calculate the critical current density (J _c) for realistic coated conductor grain structures. In-grain dissipation is included in the model in order to investigate the conditions for which grain boundaries cease to be the limiting factor. Using the model the effects of conductor dimensions and grain size have been investigated and the regimes of grain or grain boundary limitation have been addressed, with reference to the use of coated conductors in magnetic field.

Original language	English
Article number	EE5.24
Pages (from-to)	105-107
Number of pages	3
Journal	Materials Research Society Symposium - Proceedings
Volume	EXS
Issue number	3
State	Published - 2004
Event	2003 MRS Fall Meeting - Boston, MA, United States Duration: Dec 1 2003 → Dec 4 2003

Cite this

@article{dfc208d671da40f499ad83e39f5274be,

title = "Critical current modeling for coated conductor applications",

abstract = "A Monte-Carlo grain growth simulation has been coupled with existing grain boundary percolation models to calculate the critical current density (J c) for realistic coated conductor grain structures. In-grain dissipation is included in the model in order to investigate the conditions for which grain boundaries cease to be the limiting factor. Using the model the effects of conductor dimensions and grain size have been investigated and the regimes of grain or grain boundary limitation have been addressed, with reference to the use of coated conductors in magnetic field.",

author = "Rutter, \{Noel A.\} and Amit Goyal",

year = "2004",

language = "English",

volume = "EXS",

pages = "105--107",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

number = "3",

note = "2003 MRS Fall Meeting ; Conference date: 01-12-2003 Through 04-12-2003",

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TY - JOUR

T1 - Critical current modeling for coated conductor applications

AU - Rutter, Noel A.

AU - Goyal, Amit

PY - 2004

Y1 - 2004

N2 - A Monte-Carlo grain growth simulation has been coupled with existing grain boundary percolation models to calculate the critical current density (J c) for realistic coated conductor grain structures. In-grain dissipation is included in the model in order to investigate the conditions for which grain boundaries cease to be the limiting factor. Using the model the effects of conductor dimensions and grain size have been investigated and the regimes of grain or grain boundary limitation have been addressed, with reference to the use of coated conductors in magnetic field.

AB - A Monte-Carlo grain growth simulation has been coupled with existing grain boundary percolation models to calculate the critical current density (J c) for realistic coated conductor grain structures. In-grain dissipation is included in the model in order to investigate the conditions for which grain boundaries cease to be the limiting factor. Using the model the effects of conductor dimensions and grain size have been investigated and the regimes of grain or grain boundary limitation have been addressed, with reference to the use of coated conductors in magnetic field.

UR - https://www.scopus.com/pages/publications/23844525391

M3 - Conference article

AN - SCOPUS:23844525391

SN - 0272-9172

VL - EXS

SP - 105

EP - 107

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

IS - 3

M1 - EE5.24

T2 - 2003 MRS Fall Meeting

Y2 - 1 December 2003 through 4 December 2003

ER -

Critical current modeling for coated conductor applications

Abstract

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