Correlative imaging of stacking faults using atom probe tomography (APT) and scanning transmission electron microscopy (STEM)

S. Dumpala; A. A. Oni; S. Padalkar; S. R. Broderick; J. M. Lebeau; K. Rajan

doi:10.1017/S1431927614006709

Correlative imaging of stacking faults using atom probe tomography (APT) and scanning transmission electron microscopy (STEM)

S. Dumpala
, A. A. Oni
, S. Padalkar
, S. R. Broderick
, J. M. Lebeau
, K. Rajan

Department of Materials Design and Innovation

Iowa State University
North Carolina State University

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	996-997
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614006709
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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10.1017/S1431927614006709

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title = "Correlative imaging of stacking faults using atom probe tomography (APT) and scanning transmission electron microscopy (STEM)",

author = "S. Dumpala and Oni, \{A. A.\} and S. Padalkar and Broderick, \{S. R.\} and Lebeau, \{J. M.\} and K. Rajan",

year = "2014",

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doi = "10.1017/S1431927614006709",

language = "English",

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journal = "Microscopy and Microanalysis",

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TY - JOUR

T1 - Correlative imaging of stacking faults using atom probe tomography (APT) and scanning transmission electron microscopy (STEM)

AU - Dumpala, S.

AU - Oni, A. A.

AU - Padalkar, S.

AU - Broderick, S. R.

AU - Lebeau, J. M.

AU - Rajan, K.

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927939953

U2 - 10.1017/S1431927614006709

DO - 10.1017/S1431927614006709

M3 - Conference article

AN - SCOPUS:84927939953

SN - 1431-9276

VL - 20

SP - 996

EP - 997

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Correlative imaging of stacking faults using atom probe tomography (APT) and scanning transmission electron microscopy (STEM)

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