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Conduction Mechanisms in CVD-Grown Monolayer MoS2 Transistors: From Variable-Range Hopping to Velocity Saturation

  • G. He
  • , K. Ghosh
  • , U. Singisetti
  • , H. Ramamoorthy
  • , R. Somphonsane
  • , G. Bohra
  • , M. Matsunaga
  • , A. Higuchi
  • , N. Aoki
  • , S. Najmaei
  • , Y. Gong
  • , X. Zhang
  • , R. Vajtai
  • , P. M. Ajayan
  • , J. P. Bird
  • SUNY Buffalo
  • King Mongkut's Institute of Technology Ladkrabang
  • Chiba University
  • Rice University

Research output: Contribution to journal › Article › peer-review

105 Scopus citations

Abstract

We fabricate transistors from chemical vapor deposition-grown monolayer MoS2 crystals and demonstrate excellent current saturation at large drain voltages (Vd). The low-field characteristics of these devices indicate that the electron mobility is likely limited by scattering from charged impurities. The current-voltage characteristics exhibit variable range hopping at low Vd and evidence of velocity saturation at higher Vd. This work confirms the excellent potential of MoS2 as a possible channel-replacement material and highlights the role of multiple transport phenomena in governing its transistor action.

Original languageEnglish
Pages (from-to)5052-5058
Number of pages7
JournalNano Letters
Volume15
Issue number8
DOIs
StatePublished - Aug 12 2015

Keywords

  • 2D transistors
  • high-field transport
  • Molybdenum disulfide
  • transition metal dichalcogenides
  • velocity saturation

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