TY - GEN
T1 - Comparison of combination methods utilizing T-normalization and second best score model
AU - Tulyakov, Sergey
AU - Zhang, Zhi
AU - Govindaraju, Venu
PY - 2008
Y1 - 2008
N2 - The combination of biometric matching scores can be enhanced by taking into account the matching scores related to all enrolled persons in addition to traditional combinations utilizing only matching scores related to a single person. Identification models take into account the dependence between matching scores assigned to different persons and can be used for such enhancement. In this paper we compare the use of two such models - T-normalization and second best score model. The comparison is performed using two combination algorithms - likelihood ratio and multilayer perceptron. The results show, that while second best score model delivers better performance improvement than T-normalization, two models are complementary to each other and can be used together for further improvements.
AB - The combination of biometric matching scores can be enhanced by taking into account the matching scores related to all enrolled persons in addition to traditional combinations utilizing only matching scores related to a single person. Identification models take into account the dependence between matching scores assigned to different persons and can be used for such enhancement. In this paper we compare the use of two such models - T-normalization and second best score model. The comparison is performed using two combination algorithms - likelihood ratio and multilayer perceptron. The results show, that while second best score model delivers better performance improvement than T-normalization, two models are complementary to each other and can be used together for further improvements.
UR - https://www.scopus.com/pages/publications/52049090335
U2 - 10.1109/CVPRW.2008.4563105
DO - 10.1109/CVPRW.2008.4563105
M3 - Conference contribution
AN - SCOPUS:52049090335
SN - 9781424423408
T3 - 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops
BT - 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops
T2 - 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops
Y2 - 23 June 2008 through 28 June 2008
ER -